"Summing Node Test Method: Simultaneous Multiple AC Characteristics Testing ..."

Gaku Ogihara et al. (2020)

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DOI: 10.1109/ATS49688.2020.9301550

access: closed

type: Conference or Workshop Paper

metadata version: 2022-03-21

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Gaku Ogihara, Takayuki Nakatani, Akemi Hatta, Keno Sato, Takashi Ishida, Toshiyuki Okamoto, Tamotsu Ichikawa, Anna Kuwana, Riho Aoki, Shogo Katayama, Jianglin Wei, Yujie Zhao, Jianlong Wang, Kazumi Hatayama, Haruo Kobayashi:
Summing Node Test Method: Simultaneous Multiple AC Characteristics Testing of Multiple Operational Amplifiers. ATS 2020: 1-6

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