"New Capabilities of OBIRCH Method for Fault Localization and Defect Detection."

Kiyoshi Nikawa, Shoji Inoue (1997)

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DOI: 10.1109/ATS.1997.643961

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Kiyoshi Nikawa, Shoji Inoue:
New Capabilities of OBIRCH Method for Fault Localization and Defect Detection. Asian Test Symposium 1997: 214-

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