"Testing for the programming circuit of LUT-based FPGAs."

Hiroyuki Michinishi et al. (1997)

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DOI: 10.1109/ATS.1997.643965

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Hiroyuki Michinishi, Tokumi Yokohira, Takuji Okamoto, Tomoo Inoue, Hideo Fujiwara:
Testing for the programming circuit of LUT-based FPGAs. Asian Test Symposium 1997: 242-247

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