"Layout-Oriented Defect Set Reduction for Fast Circuit Simulation in ..."

Hsuan-Wei Liu, Bing-Yang Lin, Cheng-Wen Wu (2016)

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DOI: 10.1109/ATS.2016.25

access: closed

type: Conference or Workshop Paper

metadata version: 2023-09-30

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Hsuan-Wei Liu, Bing-Yang Lin, Cheng-Wen Wu:
Layout-Oriented Defect Set Reduction for Fast Circuit Simulation in Cell-Aware Test. ATS 2016: 156-160

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