"Timing-Aware ATPG for High Quality At-speed Testing of Small Delay Defects."

Xijiang Lin et al. (2006)

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DOI: 10.1109/ATS.2006.261012

access: closed

type: Conference or Workshop Paper

metadata version: 2022-11-07

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Xijiang Lin, Kun-Han Tsai, Chen Wang, Mark Kassab, Janusz Rajski, Takeo Kobayashi, Randy Klingenberg, Yasuo Sato, Shuji Hamada, Takashi Aikyo:
Timing-Aware ATPG for High Quality At-speed Testing of Small Delay Defects. ATS 2006: 139-146

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