"A Monobit Built-In Test and Diagnostic System for Flexible Electronic ..."

Jun-Yang Lei et al. (2018)

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DOI: 10.1109/ATS.2018.00044

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  - https://dblp.org/rec/conf/ats/LeiMCSC18
Jun-Yang Lei, Thomas Moon, Justin Chow, Suresh K. Sitaraman, Abhijit Chatterjee:
A Monobit Built-In Test and Diagnostic System for Flexible Electronic Interconnect. ATS 2018: 191-196

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