"A Novel BIST Scheme Using Test Vectors Applied by Circuit-under-Test Itself."

Jishun Kuang, Ouyang Xiong, Zhiqiang You (2008)

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DOI: 10.1109/ATS.2008.25

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Jishun Kuang, Ouyang Xiong, Zhiqiang You:
A Novel BIST Scheme Using Test Vectors Applied by Circuit-under-Test Itself. ATS 2008: 75-80

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