"A New Low Power Test Pattern Generator using a Transition Monitoring ..."

Youbean Kim et al. (2005)

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DOI: 10.1109/ATS.2005.12

access: closed

type: Conference or Workshop Paper

metadata version: 2024-02-28

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Youbean Kim, Myung-Hoon Yang, Yong Lee, Sungho Kang:
A New Low Power Test Pattern Generator using a Transition Monitoring Window based on BIST Architecture. Asian Test Symposium 2005: 230-235

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