"Open Defect Detection with a Built-in Test Circuit by IDDT Appearance Time ..."

Ayumu Kambara et al. (2017)

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DOI: 10.1109/ATS.2017.53

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Ayumu Kambara, Hiroyuki Yotsuyanagi, Daichi Miyoshi, Masaki Hashizume, Shyue-Kung Lu:
Open Defect Detection with a Built-in Test Circuit by IDDT Appearance Time in CMOS ICs. ATS 2017: 242-247

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