"Bipartite Full Scan Design: A DFT Method for Asynchronous Circuits."

Hiroshi Iwata et al. (2010)

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DOI: 10.1109/ATS.2010.44

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Hiroshi Iwata, Satoshi Ohtake, Michiko Inoue, Hideo Fujiwara:
Bipartite Full Scan Design: A DFT Method for Asynchronous Circuits. Asian Test Symposium 2010: 206-211

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