"Test Data Reduction for BIST-Aided Scan Test Using Compatible Flip-Flops ..."

Masashi Ishikawa, Hiroyuki Yotsuyanagi, Masaki Hashizume (2010)

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DOI: 10.1109/ATS.2010.37

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Masashi Ishikawa, Hiroyuki Yotsuyanagi, Masaki Hashizume:
Test Data Reduction for BIST-Aided Scan Test Using Compatible Flip-Flops and Shifting Inverter Code. Asian Test Symposium 2010: 163-166

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