"A class of sequential circuits with combinational test generation ..."

Michiko Inoue, Emil Gizdarski, Hideo Fujiwara (2000)

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DOI: 10.1109/ATS.2000.893656

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Michiko Inoue, Emil Gizdarski, Hideo Fujiwara:
A class of sequential circuits with combinational test generation complexity under single-fault assumption. Asian Test Symposium 2000: 398-403

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