"Universal test complexity of field-programmable gate arrays."

Tomoo Inoue et al. (1995)

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DOI: 10.1109/ATS.1995.485345

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Tomoo Inoue, Hideo Fujiwara, Hiroyuki Michinishi, Tokumi Yokohira, Takuji Okamoto:
Universal test complexity of field-programmable gate arrays. Asian Test Symposium 1995: 259-265

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