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"Hybrid BIST Using Partially Rotational Scan."
Kenichi Ichino et al. (2001)
- Kenichi Ichino, Takeshi Asakawa, Satoshi Fukumoto, Kazuhiko Iwasaki, Seiji Kajihara:
Hybrid BIST Using Partially Rotational Scan. Asian Test Symposium 2001: 379-384
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