"An Effective Design for Hierarchical Test Generation Based on Strong ..."

Hideyuki Ichihara et al. (2005)

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DOI: 10.1109/ATS.2005.23

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Hideyuki Ichihara, Tomoo Inoue, Naoki Okamoto, Toshinori Hosokawa, Hideo Fujiwara:
An Effective Design for Hierarchical Test Generation Based on Strong Testability. Asian Test Symposium 2005: 288-293

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