"Efficient Path Delay Fault Test Generation Algorithms for Weighted Random ..."

Y.-M. Hur et al. (1996)

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DOI: 10.1109/ATS.1996.10002

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type: Conference or Workshop Paper

metadata version: 2023-03-24

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Y.-M. Hur, J.-H. Shin, K.-H. Lee, Y.-S. Son, I.-C. Lim, Y.-H. Kim:
Efficient Path Delay Fault Test Generation Algorithms for Weighted Random Robust Testing. Asian Test Symposium 1996: 42-

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