"Partially Parallel Scan Chain for Test Length Reduction by Using Retiming ..."

Yoshinobu Higami, Seiji Kajihara, Kozo Kinoshita (1996)

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DOI: 10.1109/ATS.1996.555143

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Yoshinobu Higami, Seiji Kajihara, Kozo Kinoshita:
Partially Parallel Scan Chain for Test Length Reduction by Using Retiming Technique. Asian Test Symposium 1996: 94-99

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