"Simulation-Driven Thermal-Safe Test Time Minimization for System-on-Chip."

Zhiyuan He, Zebo Peng, Petru Eles (2008)

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DOI: 10.1109/ATS.2008.79

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Zhiyuan He, Zebo Peng, Petru Eles:
Simulation-Driven Thermal-Safe Test Time Minimization for System-on-Chip. ATS 2008: 283-288

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