"Low Power Oriented Test Modification and Compression Techniques for Scan ..."

Terumine Hayashi et al. (2006)

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DOI: 10.1109/ATS.2006.260951

access: closed

type: Conference or Workshop Paper

metadata version: 2022-11-07

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Terumine Hayashi, Naotsugu Ikeda, Tsuyoshi Shinogi, Haruhiko Takase, Hidehiko Kita:
Low Power Oriented Test Modification and Compression Techniques for Scan Based Core Testing. ATS 2006: 327-332

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