"Built-out Self-Test (BOST) for Analog Circuits in a System LSI: Test ..."

Hisayoshi Hanai et al. (2001)

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DOI: 10.1109/ATS.2001.990330

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Hisayoshi Hanai, Shinji Yamada, Hisaya Mori, Eisaku Yamashita, Teruhiko Funakura:
Built-out Self-Test (BOST) for Analog Circuits in a System LSI: Test Solution to Reduce Test Costs. Asian Test Symposium 2001: 460

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