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"Reduced-Complexity Transition-Fault Test Generation for Non-scan Circuits ..."
Valerio Guarnieri, Franco Fummi, Krishnendu Chakrabarty (2012)
- Valerio Guarnieri, Franco Fummi, Krishnendu Chakrabarty:
Reduced-Complexity Transition-Fault Test Generation for Non-scan Circuits through High-Level Mutant Injection. Asian Test Symposium 2012: 302-307
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