"Scan Chain Fault Identification Using Weight-Based Codes for SoC Circuits."

Swaroop Ghosh et al. (2004)

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DOI: 10.1109/ATS.2004.77

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Swaroop Ghosh, K. W. Lai, Wen-Ben Jone, Shih-Chieh Chang:
Scan Chain Fault Identification Using Weight-Based Codes for SoC Circuits. Asian Test Symposium 2004: 210-215

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