"Compressing Test Data for Deterministic BIST Using a Reconfigurable Scan ..."

Hideo Fujiwara et al. (2006)

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DOI: 10.1109/ATS.2006.261035

access: closed

type: Conference or Workshop Paper

metadata version: 2022-12-06

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Hideo Fujiwara, Jiaguang Sun, Krishnendu Chakrabarty, Yang Zhao, Dong Xiang:
Compressing Test Data for Deterministic BIST Using a Reconfigurable Scan Arhcitecture. ATS 2006: 299-306

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