"Circuit Parameter Independent Test Pattern Generation for Interconnect ..."

Dominik Erb et al. (2014)

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DOI: 10.1109/ATS.2014.34

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  - https://dblp.org/rec/conf/ats/ErbSSRB14
Dominik Erb, Karsten Scheibler, Matthias Sauer, Sudhakar M. Reddy, Bernd Becker:
Circuit Parameter Independent Test Pattern Generation for Interconnect Open Defects. ATS 2014: 131-136

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