"XPDF-ATPG: An Efficient Test Pattern Generation for Crosstalk-Induced Faults."

Sunghoon Chun et al. (2008)

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DOI: 10.1109/ATS.2008.57

access: closed

type: Conference or Workshop Paper

metadata version: 2024-02-27

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  - conf/ats/ChunKKYK08
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  - https://dblp.org/rec/conf/ats/ChunKKYK08
Sunghoon Chun, YongJoon Kim, Taejin Kim, Myung-Hoon Yang, Sungho Kang:
XPDF-ATPG: An Efficient Test Pattern Generation for Crosstalk-Induced Faults. ATS 2008: 83-88

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