"A Test Pattern Generation Algorithm Exploiting Behavioral Information."

Silvia Chiusano, Fulvio Corno, Paolo Prinetto (1998)

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DOI: 10.1109/ATS.1998.741660

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Silvia Chiusano, Fulvio Corno, Paolo Prinetto:
A Test Pattern Generation Algorithm Exploiting Behavioral Information. Asian Test Symposium 1998: 480-485

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