"BIST TPG for SRAM cluster interconnect testing at board level."

Chen-Huan Chiang, Sandeep K. Gupta (2000)

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DOI: 10.1109/ATS.2000.893603

access: closed

type: Conference or Workshop Paper

metadata version: 2023-09-22

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Chen-Huan Chiang, Sandeep K. Gupta:
BIST TPG for SRAM cluster interconnect testing at board level. Asian Test Symposium 2000: 58-65

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