"Power-Aware Test Pattern Generation for At-Speed LOS Testing."

Alberto Bosio et al. (2011)

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DOI: 10.1109/ATS.2011.50

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri, Arnaud Virazel, Kohei Miyase, Xiaoqing Wen:
Power-Aware Test Pattern Generation for At-Speed LOS Testing. Asian Test Symposium 2011: 506-510

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