"A Built-In Loopback Test Methodology for RF Transceiver Circuits Using ..."

Soumendu Bhattacharya, Abhijit Chatterjee (2004)

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DOI: 10.1109/ATS.2004.7

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Soumendu Bhattacharya, Abhijit Chatterjee:
A Built-In Loopback Test Methodology for RF Transceiver Circuits Using Embedded Sensor Circuits. Asian Test Symposium 2004: 68-73

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