"Built-In Self-Test for Capacitive MEMS Using a Charge Control Technique."

Iftekhar Ibne Basith, Nabeeh Kandalaft, Rashid Rashidzadeh (2010)

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DOI: 10.1109/ATS.2010.32

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Iftekhar Ibne Basith, Nabeeh Kandalaft, Rashid Rashidzadeh:
Built-In Self-Test for Capacitive MEMS Using a Charge Control Technique. Asian Test Symposium 2010: 135-140

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