"State-reuse Test Generation for Progressive Random Access Scan: Solution ..."

Dong Hyun Baik, Kewal K. Saluja (2005)

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DOI: 10.1109/ATS.2005.101

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Dong Hyun Baik, Kewal K. Saluja:
State-reuse Test Generation for Progressive Random Access Scan: Solution to Test Power, Application Time and Data Size. Asian Test Symposium 2005: 272-277

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