"Soft Error Issues with Scaling Technologies."

Sanghyeon Baeg et al. (2012)

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DOI: 10.1109/ATS.2012.72

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Sanghyeon Baeg, Jongsun Bae, Soonyoung Lee, Chul Seung Lim, Sang Hoon Jeon, Hyeonwoo Nam:
Soft Error Issues with Scaling Technologies. Asian Test Symposium 2012: 68

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