"Device Aware Diagnosis for Unique Defects in STT-MRAMs."

Ahmed Aouichi et al. (2023)

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DOI: 10.1109/ATS59501.2023.10317952

access: closed

type: Conference or Workshop Paper

metadata version: 2024-02-05

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Ahmed Aouichi, Sicong Yuan, Moritz Fieback, Siddharth Rao, Woojin Kim, Erik Jan Marinissen, Sebastien Couet, Mottaqiallah Taouil, Said Hamdioui:
Device Aware Diagnosis for Unique Defects in STT-MRAMs. ATS 2023: 1-6

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