"Design for Hierarchical Two-Pattern Testability of Data Paths."

Md. Altaf-Ul-Amin, Satoshi Ohtake, Hideo Fujiwara (2001)

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DOI: 10.1109/ATS.2001.990251

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Md. Altaf-Ul-Amin, Satoshi Ohtake, Hideo Fujiwara:
Design for Hierarchical Two-Pattern Testability of Data Paths. Asian Test Symposium 2001: 11-16

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