"Automated Test Model Generation from Switch Level Custom Circuits."

Magdy S. Abadir et al. (2003)

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DOI: 10.1109/ATS.2003.1250807

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Magdy S. Abadir, Jing Zeng, Carol Pyron, Juhong Zhu:
Automated Test Model Generation from Switch Level Custom Circuits. Asian Test Symposium 2003: 184-189

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