"40 nm Dual-port and two-port SRAMs for automotive MCU applications under ..."

Yoshisato Yokoyama et al. (2014)

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DOI: 10.1109/ASSCC.2014.7008851

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-24

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Yoshisato Yokoyama, Yuichiro Ishii, Koji Tanaka, Tatsuya Fukuda, Yoshiki Tsujihashi, Atsushi Miyanishi, Shinobu Asayama, Keiichi Maekawa, Kazutoshi Shiba, Koji Nii:
40 nm Dual-port and two-port SRAMs for automotive MCU applications under the wide temperature range of -40 to 170°C with test screening against write disturb issues. A-SSCC 2014: 25-28

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