"A digital intensive circuit for low-frequency noise monitoring in 28nm CMOS."

Bertrand Parvais et al. (2015)

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DOI: 10.1109/ASSCC.2015.7387446

access: closed

type: Conference or Workshop Paper

metadata version: 2021-04-09

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Bertrand Parvais, Piet Wambacq, Abdelkarim Mercha, Diederik Verkest, Aaron Thean, Ken Sawada, Kazuki Nomoto, Tetsuya Oishi, Hiroaki Ammo:
A digital intensive circuit for low-frequency noise monitoring in 28nm CMOS. A-SSCC 2015: 1-4

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