"Energy efficiency degradation caused by random variation in low-voltage ..."

Atsushi Kawasumi et al. (2011)

> Home

Details and statistics

DOI: 10.1109/ASSCC.2011.6123628

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-24

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/asscc/KawasumiSMM11
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/asscc/KawasumiSMM11
Atsushi Kawasumi, Toshikazu Suzuki, Shinichi Moriwaki, Shinji Miyano:
Energy efficiency degradation caused by random variation in low-voltage SRAM and 26% energy reduction by Bitline Amplitude Limiting (BAL) scheme. A-SSCC 2011: 165-168

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.