"Learning from mistakes: a comprehensive study on real world concurrency ..."

Shan Lu et al. (2008)

> Home

Details and statistics

DOI: 10.1145/1346281.1346323

access: closed

type: Conference or Workshop Paper

metadata version: 2021-07-07

- view
  authority control:
- export record
  dblp key:
  - conf/asplos/LuPSZ08
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/asplos/LuPSZ08
Shan Lu, Soyeon Park, Eunsoo Seo, Yuanyuan Zhou:
Learning from mistakes: a comprehensive study on real world concurrency bug characteristics. ASPLOS 2008: 329-339

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.