"Enhancing Generalization of Wafer Defect Detection by Data ..."

Chaofei Yang et al. (2020)

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DOI: 10.1109/ASP-DAC47756.2020.9045391

access: closed

type: Conference or Workshop Paper

metadata version: 2022-07-04

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Chaofei Yang, Hai Li, Yiran Chen, Jiang Hu:
Enhancing Generalization of Wafer Defect Detection by Data Discrepancy-aware Preprocessing and Contrast-varied Augmentation. ASP-DAC 2020: 145-150

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