"Bridging fault testability of BDD circuits."

Junhao Shi, Görschwin Fey, Rolf Drechsler (2005)

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DOI: 10.1145/1120725.1120801

access: closed

type: Conference or Workshop Paper

metadata version: 2018-11-06

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Junhao Shi, Görschwin Fey, Rolf Drechsler:
Bridging fault testability of BDD circuits. ASP-DAC 2005: 188-191

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