"A DFT method for RTL circuits to achieve complete fault efficiency based ..."

Satoshi Ohtake et al. (2001)

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DOI: 10.1145/370155.370371

access: closed

type: Conference or Workshop Paper

metadata version: 2018-11-06

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Satoshi Ohtake, Shintaro Nagai, Hiroki Wada, Hideo Fujiwara:
A DFT method for RTL circuits to achieve complete fault efficiency based on fixed-control testability. ASP-DAC 2001: 331-334

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