"Gate-level aged timing simulation methodology for hot-carrier reliability ..."

Yoshiyuki Kawakami et al. (2000)

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DOI: 10.1145/368434.368636

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Yoshiyuki Kawakami, Jingkun Fang, Hirokazu Yonezawa, Nobufusa Iwanishi, Lifeng Wu, Alvin I-Hsien Chen, Norio Koike, Ping Chen, Chune-Sin Yeh, Zhihong Liu:
Gate-level aged timing simulation methodology for hot-carrier reliability assurance. ASP-DAC 2000: 289-294

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