"Measurement results of within-die variations on a 90nm LUT array for speed ..."

Kazuya Katsuki et al. (2006)

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DOI: 10.1109/ASPDAC.2006.1594661

access: closed

type: Conference or Workshop Paper

metadata version: 2018-11-06

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Kazuya Katsuki, Manabu Kotani, Kazutoshi Kobayashi, Hidetoshi Onodera:
Measurement results of within-die variations on a 90nm LUT array for speed and yield enhancement of reconfigurable devices. ASP-DAC 2006: 110-111

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