"Electromigration recovery modeling and analysis under time-dependent ..."

Xin Huang et al. (2016)

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DOI: 10.1109/ASPDAC.2016.7428018

access: closed

type: Conference or Workshop Paper

metadata version: 2019-06-02

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Xin Huang, Valeriy Sukharev, Taeyoung Kim, Hai-Bao Chen, Sheldon X.-D. Tan:
Electromigration recovery modeling and analysis under time-dependent current and temperature stressing. ASP-DAC 2016: 244-249

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