"Design for testability strategies using full/partial scan designs and test ..."

Toshinori Hosokawa, Masayoshi Yoshimura, Mitsuyasu Ohta (2001)

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DOI: 10.1145/370155.370517

access: closed

type: Conference or Workshop Paper

metadata version: 2018-11-06

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Toshinori Hosokawa, Masayoshi Yoshimura, Mitsuyasu Ohta:
Design for testability strategies using full/partial scan designs and test point insertions to reduce test application times. ASP-DAC 2001: 485-491

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