"Compaction of pass/fail-based diagnostic test vectors for combinational ..."

Yoshinobu Higami et al. (2006)

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DOI: 10.1109/ASPDAC.2006.1594761

access: closed

type: Conference or Workshop Paper

metadata version: 2018-11-06

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Yoshinobu Higami, Kewal K. Saluja, Hiroshi Takahashi, Shin-ya Kobayashi, Yuzo Takamatsu:
Compaction of pass/fail-based diagnostic test vectors for combinational and sequential circuits. ASP-DAC 2006: 659-664

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