"A built-in self test scheme for VLSI."

T. Raju Damarla et al. (1995)

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DOI: 10.1145/224818.224901

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-26

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T. Raju Damarla, Wei Su, Gerald T. Michael, Moon J. Chung, Charles E. Stroud:
A built-in self test scheme for VLSI. ASP-DAC 1995

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