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"Extending trace history through tapered summaries in post-silicon validation."
Sandeep Chandran et al. (2016)
- Sandeep Chandran, Preeti Ranjan Panda, Deepak Chauhan, Sharad Kumar, Smruti R. Sarangi:
Extending trace history through tapered summaries in post-silicon validation. ASP-DAC 2016: 737-742
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