"A tool for measuring quality of test pattern for LSIs' functional design."

Takashi Aoki et al. (1995)

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DOI: 10.1145/224818.224956

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-26

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Takashi Aoki, Tomoji Toriyama, Kenji Ishikawa, Kennosuke Fukami:
A tool for measuring quality of test pattern for LSIs' functional design. ASP-DAC 1995

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